PSO for Minimizing Makespan of Non-Identical Parallel Batch Processing Machines

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dc.contributor.authorDamodaranspa
dc.contributor.authorPurushothamanspa
dc.contributor.authorDiyadawagamagespa
dc.contributor.authorDon Asankaspa
dc.contributor.authorMario C. Vélez-Gallegospa
dc.contributor.departmentUniversidad EAFIT. Departamento de Ingeniería de Producciónspa
dc.contributor.researchgroupGestión de Producción y Logísticaspa
dc.date.accessioned2021-04-12T19:59:19Z
dc.date.available2021-04-12T19:59:19Z
dc.date.issued2011-05-25
dc.description.abstractEnvironmental Stress Screening (ESS) chambers are commonly used to test Printed Circuit Boards (PCBs) to detect early failures before they are used in the field. This research is motivated by our interactions with an electronics manufacturereng
dc.identifierhttps://eafit.fundanetsuite.com/Publicaciones/ProdCientif/PublicacionFrw.aspx?id=4814
dc.identifier.isbn9780983762409
dc.identifier.urihttp://hdl.handle.net/10784/28514
dc.language.isoeng
dc.publisherInstitute of Industrial Engineers ( IIE )
dc.rightsInstitute of Industrial Engineers ( IIE )
dc.source61st Annual IIE Conference and Expo Proceedings
dc.subjectBatch processing machineseng
dc.subjectnon-identical machineseng
dc.subjectmakespaneng
dc.subjectParticle Swarm Optimizationeng
dc.titlePSO for Minimizing Makespan of Non-Identical Parallel Batch Processing Machineseng
dc.typeinfo:eu-repo/semantics/bookParteng
dc.typebookParteng
dc.typeinfo:eu-repo/semantics/publishedVersioneng
dc.typepublishedVersioneng
dc.type.localCapítulo o parte de un librospa

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