Dielectric properties characterization of high dielectric constant thick films
dc.citation.journalTitle | Microwave and Optical Technology Letters | eng |
dc.contributor.author | Demenicis, Luciene S. | |
dc.contributor.author | J. I. Marulanda | |
dc.contributor.author | Lima, Rodolfo A. A. | |
dc.contributor.author | Carvalho, Maria Cristina R. | |
dc.contributor.department | Universidad EAFIT. Departamento de Ciencias Básicas | spa |
dc.contributor.researchgroup | Óptica Aplicada | spa |
dc.date.accessioned | 2021-04-12T14:17:31Z | |
dc.date.available | 2021-04-12T14:17:31Z | |
dc.date.issued | 2010-10-01 | |
dc.description.abstract | A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposit | eng |
dc.identifier | https://eafit.fundanetsuite.com/Publicaciones/ProdCientif/PublicacionFrw.aspx?id=4948 | |
dc.identifier.doi | 10.1002/mop.25440 | |
dc.identifier.issn | 10982760 | |
dc.identifier.issn | 08952477 | |
dc.identifier.uri | http://hdl.handle.net/10784/27934 | |
dc.language | eng | |
dc.language.iso | eng | eng |
dc.publisher | John Wiley & Sons | |
dc.relation.uri | https://onlinelibrary.wiley.com/doi/abs/10.1002/mop.25440 | |
dc.rights | https://v2.sherpa.ac.uk/id/publication/issn/1098-2760 | |
dc.source | Microwave and Optical Technology Letters | |
dc.subject.keyword | microwave complex permittivity | eng |
dc.subject.keyword | dielectric characterizationmethods | eng |
dc.subject.keyword | thick films | eng |
dc.subject.keyword | coplanar waveguide | eng |
dc.subject.keyword | barium-titanate | eng |
dc.title | Dielectric properties characterization of high dielectric constant thick films | eng |
dc.type | info:eu-repo/semantics/article | eng |
dc.type | article | eng |
dc.type | info:eu-repo/semantics/publishedVersion | eng |
dc.type | publishedVersion | eng |
dc.type.local | Artículo | spa |
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