Dielectric properties characterization of high dielectric constant thick films

dc.citation.journalTitleMicrowave and Optical Technology Letterseng
dc.contributor.authorDemenicis, Luciene S.
dc.contributor.authorJ. I. Marulanda
dc.contributor.authorLima, Rodolfo A. A.
dc.contributor.authorCarvalho, Maria Cristina R.
dc.contributor.departmentUniversidad EAFIT. Departamento de Ciencias Básicasspa
dc.contributor.researchgroupÓptica Aplicadaspa
dc.date.accessioned2021-04-12T14:17:31Z
dc.date.available2021-04-12T14:17:31Z
dc.date.issued2010-10-01
dc.description.abstractA technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films depositeng
dc.identifierhttps://eafit.fundanetsuite.com/Publicaciones/ProdCientif/PublicacionFrw.aspx?id=4948
dc.identifier.doi10.1002/mop.25440
dc.identifier.issn10982760
dc.identifier.issn08952477
dc.identifier.urihttp://hdl.handle.net/10784/27934
dc.languageeng
dc.language.isoengeng
dc.publisherJohn Wiley & Sons
dc.relation.urihttps://onlinelibrary.wiley.com/doi/abs/10.1002/mop.25440
dc.rightshttps://v2.sherpa.ac.uk/id/publication/issn/1098-2760
dc.sourceMicrowave and Optical Technology Letters
dc.subject.keywordmicrowave complex permittivityeng
dc.subject.keyworddielectric characterizationmethodseng
dc.subject.keywordthick filmseng
dc.subject.keywordcoplanar waveguideeng
dc.subject.keywordbarium-titanateeng
dc.titleDielectric properties characterization of high dielectric constant thick filmseng
dc.typeinfo:eu-repo/semantics/articleeng
dc.typearticleeng
dc.typeinfo:eu-repo/semantics/publishedVersioneng
dc.typepublishedVersioneng
dc.type.localArtículospa

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