Dielectric properties characterization of high dielectric constant thick films

Fecha

2010-10-01

Autores

Demenicis, Luciene S.
J. I. Marulanda
Lima, Rodolfo A. A.
Carvalho, Maria Cristina R.

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John Wiley & Sons

Resumen

A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposit

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