Dielectric properties characterization of high dielectric constant thick films

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Micro Optical Tech Letters - 2010 - Demenicis - Dielectric properties characterization of high dielectric constant thick.pdf (705.96 KB)

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2010-10-01

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John Wiley & Sons

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A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposit

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http://hdl.handle.net/10784/27934

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