Dielectric properties characterization of high dielectric constant thick films
Fecha
2010-10-01
Autores
Demenicis, Luciene S.
J. I. Marulanda
Lima, Rodolfo A. A.
Carvalho, Maria Cristina R.
relationships.isAdvisorOf
Título de la revista
ISSN de la revista
10982760
08952477
08952477
Título del volumen
Editor
John Wiley & Sons
item.page.isbn
Resumen
A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposit