Dielectric properties characterization of high dielectric constant thick films
Fecha
2010-10-01
Autores
Demenicis, Luciene S.
J. I. Marulanda
Lima, Rodolfo A. A.
Carvalho, Maria Cristina R.
Título de la revista
ISSN de la revista
Título del volumen
Editor
John Wiley & Sons
Resumen
A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposit