Examinando por Autor "Don Asanka"
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Ítem PSO for Minimizing Makespan of Non-Identical Parallel Batch Processing Machines(Institute of Industrial Engineers ( IIE ), 2011-05-25) Damodaran; Purushothaman; Diyadawagamage; Don Asanka; Mario C. Vélez-Gallego; Universidad EAFIT. Departamento de Ingeniería de Producción; Gestión de Producción y LogísticaEnvironmental Stress Screening (ESS) chambers are commonly used to test Printed Circuit Boards (PCBs) to detect early failures before they are used in the field. This research is motivated by our interactions with an electronics manufacturer