Examinando por Autor "Carvalho, Maria Cristina R."
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Ítem Dielectric properties characterization of high dielectric constant thick films(John Wiley & Sons, 2010-10-01) Demenicis, Luciene S.; J. I. Marulanda; Lima, Rodolfo A. A.; Carvalho, Maria Cristina R.; Universidad EAFIT. Departamento de Ciencias Básicas; Óptica AplicadaA technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films depositÍtem Dielectric properties characterization of high dielectric constant thick films(John Wiley & Sons, 2010-10-01) Demenicis, Luciene S.; J. I. Marulanda; Lima, Rodolfo A. A.; Carvalho, Maria Cristina R.; Universidad EAFIT. Departamento de Ciencias Básicas; Electromagnetismo Aplicado (Gema)A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposit