2021-04-122012-01-0100304018WOS;000300200200010http://hdl.handle.net/10784/27942Using both high dynamic range (HDR) and normalization methodologies, we show a method to improve the fringe pattern contrast in interferometric measurements normally used for phase recovering. In a simulated interferogram that mimics the main effects that can be found in an interferometric process (stray-light, photon noise, electronic noise, scattering phenomena, etc.) it was possible to improve the contrast of the fringes and to decrease the root mean square error by more than 35%. The method proposed is applied to experimental interferograms to measure wavefront error and retardance changes on liquid crystal (LC) devices. It is done by using a Mach-Zehnder set-up in which we used different polarization areas. The proposed method increases the quality of the phase recovered and decreases the root mean square error by 50%. © 2011 Elsevier B.V. All rights reserved.enghttps://v2.sherpa.ac.uk/id/publication/issn/0030-4018info:eu-repo/semantics/articleElectronic noiseFringe analysisFringe patternHigh dynamic rangeInterferogramsInterferometric measurementMach-ZehnderMain effectMulti-frameNormalizationNormalization algorithmsPhase recoveringPhoton noiseRetardanceRoot mean square errorsSignal to noiseWavefront errorsLiquid crystalsMean square errorSignal to noise ratioInterferometry2021-04-12Restrepo, R.Uribe-Patarroyo, N.Belenguer, T.10.1016/j.optcom.2011.10.077