Microwave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Gel

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dc.citation.journalTitleREVISTA FACULTAD DE INGENIERIA, UNIVERSIDAD PEDAGOGICA Y TECNOLOGICA DE COLOMBIAeng
dc.contributor.authorMarulanda-Bernal, Jose-Ignacio
dc.contributor.authorGallo-Castrillon, Wilson-Henry
dc.contributor.authorMosquera-Palacio, Diana-Marybel
dc.contributor.departmentUniversidad EAFIT. Departamento de Ciencias Básicasspa
dc.contributor.researchgroupÓptica Aplicadaspa
dc.date.accessioned2021-04-12T14:18:45Z
dc.date.available2021-04-12T14:18:45Z
dc.date.issued2019-12-03
dc.description.abstractThe present work focuses on the structural, morphological and dielectric characterization of barium titanate films (BTO or BaTiO3 due to its chemical formula) deposited by spin coating on crystalline silicon (Si) substrates and CPW resonators using the Sol-Gel technique with a Ba/Ti molar ratio of 0.5/0.5. The coplanar waveguides were manufactured on alumina substrates (Al2O3) with 3 mu m of gold (Au) metallization using the laser ablation technique. The scanning electron microscopy (SEM) with X-ray energy dispersion spectrometry (EDS) showed the existence of a BTO film with an elementary composition of 14.62% barium and 5.65% titanium, with a thickness of 0.77 mu m measured using the profilometric mode of the atomic force microscopy (AFM). Dielectric characterization was carried out by comparing the frequency response (parameter S-21) of a CPW resonator with deposited BTO film and another reference resonator (without film) using a network vector analyzer (VNA). These measurements are compared in turn with computational simulations to obtain the dielectric properties. For the BTO film was determined a relative dielectric constant constant (epsilon r) of 160 with a loss tangent (Tan delta) of 0.012 for a frequency of 3.60 GHz. The dielectric constant constant and the ferroelectric property of the material produced are quite promising for applications in microwave circuits, such as miniaturization and tuning.eng
dc.identifierhttps://eafit.fundanetsuite.com/Publicaciones/ProdCientif/PublicacionFrw.aspx?id=9828
dc.identifier.doi10.19053/01211129.v29.n54.2020.10416
dc.identifier.issn01211129
dc.identifier.issn23575328
dc.identifier.otherWOS;000501992300001
dc.identifier.urihttp://hdl.handle.net/10784/28005
dc.languageeng
dc.language.isoengeng
dc.publisherRev. Fac. Ing
dc.rightshttps://v2.sherpa.ac.uk/id/publication/issn/0121-1129
dc.sourceREVISTA FACULTAD DE INGENIERIA, UNIVERSIDAD PEDAGOGICA Y TECNOLOGICA DE COLOMBIA
dc.subject.keyworddielectric constanteng
dc.subject.keywordferroelectricseng
dc.subject.keywordmicrowave materialseng
dc.subject.keywordloss tangenteng
dc.subject.keywordSol-Geleng
dc.subject.keywordthin filmseng
dc.titleMicrowave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Geleng
dc.typeinfo:eu-repo/semantics/articleeng
dc.typearticleeng
dc.typeinfo:eu-repo/semantics/publishedVersioneng
dc.typepublishedVersioneng
dc.type.localArtículospa

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