Inspection of an extended surface by an active 3D multiresolution technique

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dc.contributor.authorVargas, J.
dc.contributor.authorRestrepo, R.
dc.contributor.authorQuiroga, J.A.
dc.contributor.authorBelenguer, T.
dc.contributor.departmentUniversidad EAFIT. Departamento de Ciencias Básicasspa
dc.contributor.researchgroupÓptica Aplicadaspa
dc.date.accessioned2021-04-12T14:18:29Z
dc.date.available2021-04-12T14:18:29Z
dc.date.issued2009-01-01
dc.description.abstractReliable inspection of large surfaces with low depth recovery error is needed in a wide variety of industrial applications, for example in deformation measurement or defect inspection of extended surfaces as communication antennas. Active triangulation measurement systems present a compromise between the depth recovery error and the measured area. For an optimized active three-dimensional measuring system the expected ratio between the depth resolution and the inspected area is in the rage of 10-4. Therefore, if we want to scan a large object with a high level of detail we need multiresolution techniques. In this work we demonstrate the application of an active triangulation multiresolution method for the inspection of communication antennas. The technique is based on a standard camera-projector system. The result is a global measurement formed by a set of superposed local measurement with high depth resolution. © 2009 Springer-Verlag Berlin Heidelberg.eng
dc.identifierhttps://eafit.fundanetsuite.com/Publicaciones/ProdCientif/PublicacionFrw.aspx?id=5505
dc.identifier.doi10.1007/978-3-642-03051-2-99
dc.identifier.isbn9783642030505
dc.identifier.urihttp://hdl.handle.net/10784/27975
dc.language.isoengeng
dc.publisherSpringer-Verlag Berlin Heidelberg
dc.rightsSpringer-Verlag Berlin Heidelberg
dc.sourceInspection Of An Extended Surface By An Active 3d Multiresolution Technique
dc.subject.keywordAntennaseng
dc.subject.keywordCommunicationeng
dc.subject.keywordIndustrial applicationseng
dc.subject.keywordMeasurementseng
dc.subject.keywordTriangulationeng
dc.subject.keywordActive triangulationeng
dc.subject.keywordCamera-projector systemseng
dc.subject.keywordCommunication antennaseng
dc.subject.keywordDeformation measurementseng
dc.subject.keywordGlobal measurementseng
dc.subject.keywordMeasurement systemeng
dc.subject.keywordMulti-resolution techniqueseng
dc.subject.keywordMultiresolution methodseng
dc.subject.keywordInspectioneng
dc.titleInspection of an extended surface by an active 3D multiresolution techniqueeng
dc.typeinfo:eu-repo/semantics/conferencePapereng
dc.typeconferencePapereng
dc.typeinfo:eu-repo/semantics/publishedVersioneng
dc.typepublishedVersioneng
dc.type.localDocumento de conferenciaspa

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