Speckle decorrelation influence on measurements quality in vortex metrology

Vista sencilla de ítem
dc.citation.journalTitleOPTICS COMMUNICATIONSeng
dc.contributor.authorAngel-Toro, Luciano
dc.contributor.authorSierra-Sosa, Daniel
dc.contributor.authorTebaldi, Myrian
dc.contributor.authorBolognini, Nestor
dc.contributor.departmentUniversidad EAFIT. Departamento de Ciencias Básicasspa
dc.contributor.researchgroupÓptica Aplicadaspa
dc.date.accessioned2021-04-12T14:17:29Z
dc.date.available2021-04-12T14:17:29Z
dc.date.issued2012-10-01
dc.description.abstractWe study speckle decorrelation effects in connection with conventional vortex metrology techniques. Our proposal is based on processing speckled images recorded by using two different experimental set-ups. In both schemes two laterally displaced patterns are generated: one scheme allows for obtaining undecorrelated speckle distributions and the other for decorrelated ones. Vortex networks associated with speckle patterns are analyzed by employing the usual tools developed for vortex metrology. For each recorded image, a 2D pseudo-phase map is generated on the basis of the Reisz transform. Then the vortices are located, and parameterized in terms of their topological charge, eccentricity, vorticity and angles between the zero crossing lines from the real and the imaginary parts of the analytical signal. After tracking the homologous vortices onto the maps, the histograms corresponding to the coordinate displacements are analyzed. We show that histograms interpretation is prone to failure due to its high sensitivity to decorrelation. Experimental evidences are presented to support the restrictions imposed by decorrelation of actual speckles due to uniform in-plane displacements. © 2012 Elsevier B.V. All rights reserved.eng
dc.identifierhttps://eafit.fundanetsuite.com/Publicaciones/ProdCientif/PublicacionFrw.aspx?id=1346
dc.identifier.doi10.1016/j.optcom.2012.07.021
dc.identifier.issn00304018
dc.identifier.otherWOS;000309081600030
dc.identifier.otherSCOPUS;2-s2.0-84865695715
dc.identifier.urihttp://hdl.handle.net/10784/27918
dc.languageeng
dc.language.isoengeng
dc.publisherELSEVIER SCIENCE BV
dc.relation.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84865695715&doi=10.1016%2fj.optcom.2012.07.021&partnerID=40&md5=8fa2929e7bac3910ff3468e82fa8ba67
dc.rightshttps://v2.sherpa.ac.uk/id/publication/issn/0030-4018
dc.sourceOPTICS COMMUNICATIONS
dc.subject.keywordAnalytical signalseng
dc.subject.keywordDecorrelationseng
dc.subject.keywordExperimental evidenceeng
dc.subject.keywordHigh sensitivityeng
dc.subject.keywordImaginary partseng
dc.subject.keywordIn-plane displacementeng
dc.subject.keywordOptical processingeng
dc.subject.keywordParameterizedeng
dc.subject.keywordPseudo-phaseeng
dc.subject.keywordSet-upseng
dc.subject.keywordSpeckle decorrelationeng
dc.subject.keywordSpeckle distributioneng
dc.subject.keywordSpeckle patternseng
dc.subject.keywordSpeckled imageseng
dc.subject.keywordTopological chargeseng
dc.subject.keywordZero-crossingseng
dc.subject.keywordFourier opticseng
dc.subject.keywordGraphic methodseng
dc.subject.keywordMeasurementseng
dc.subject.keywordSpeckleeng
dc.subject.keywordUnits of measurementeng
dc.subject.keywordVortex floweng
dc.titleSpeckle decorrelation influence on measurements quality in vortex metrologyeng
dc.typeinfo:eu-repo/semantics/articleeng
dc.typearticleeng
dc.typeinfo:eu-repo/semantics/publishedVersioneng
dc.typepublishedVersioneng
dc.type.localArtículospa

Archivos

Bloque original
Mostrando 1 - 1 de 1
No hay miniatura disponible
Nombre:
1-s2.0-S0030401812006694-main.pdf
Tamaño:
510.04 KB
Formato:
Adobe Portable Document Format
Descripción:
Descargar

Colecciones

Artículos