Examinando por Materia "Deformation measurements"
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Ítem Inspection of an extended surface by an active 3D multiresolution technique(Springer-Verlag Berlin Heidelberg, 2009-01-01) Vargas, J.; Restrepo, R.; Quiroga, J.A.; Belenguer, T.; Universidad EAFIT. Departamento de Ciencias Básicas; Óptica AplicadaReliable inspection of large surfaces with low depth recovery error is needed in a wide variety of industrial applications, for example in deformation measurement or defect inspection of extended surfaces as communication antennas. Active triangulation measurement systems present a compromise between the depth recovery error and the measured area. For an optimized active three-dimensional measuring system the expected ratio between the depth resolution and the inspected area is in the rage of 10-4. Therefore, if we want to scan a large object with a high level of detail we need multiresolution techniques. In this work we demonstrate the application of an active triangulation multiresolution method for the inspection of communication antennas. The technique is based on a standard camera-projector system. The result is a global measurement formed by a set of superposed local measurement with high depth resolution. © 2009 Springer-Verlag Berlin Heidelberg.