Examinando por Materia "Atomic Force Microscopy (AFM)"

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    Obtención de estructuras de relieve en materiales de registro de haluros de plata
    (Sociedad Española de Óptica, 2013-01) Giraldo, L.M; Velásquez, D.; Giraldo, L.M; Velásquez, D.; Universidad EAFIT. Departamento de Ciencias Básicas; Óptica Aplicada
    Diffraction transmission gratings were recorded in AGFA-8E75 film, chemically treated under processes with D-19 + potassium ferrocyanide and a chemical processing technique proposed for PE-2 film to obtain embossed stripes. Holographic structures were measured topographically by the technique of atomic force microscopy in noncontact mode (NC-AFM) and we observe changes in the depths under variations in exposures and used photochemistry. We find that the best performance in terms of relief depth obtained is given by the conventional process which reached depths between 0.15 m and 0.3 m for spatial frequencies of the order of 400